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 Materials Testing Division
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The TEC 4000 X-Ray Diffraction System

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 The TEC 4000 X-Ray Diffraction SystemDesigned for ease of use, speed, flexibility, and portability, this compact system includes a diffractometer, control cabinet, and personal computer.
The system’s ergonomic design and sample autodistancing feature make it easy to set-up. The TEC 4000 system can operate with either one or two detectors and perform single, double, or multiple exposures for fast, accurate, flexible measurements. Measurement data is analyzed with TEC’s user-friendly, Windows-based SaraTEC™ software that is included with the system. This compact system can perform in the laboratory, on the shop floor, or in the field. For even more portability, the personal computer can be easily replaced with a laptop computer.

TEC stress analyzers have been in continuous operation worldwide for almost 20 years. The TEC 4000 X-Ray Diffraction System combines TEC’s proven accurate technique with streamlined adaptability in an instrument capable of performing anywhere, anytime.
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21.gif (75 bytes) Mobile system brings the lab to the work for efficient measurements
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Large Parts can be measured easily with the TEC 4000
Large Parts		 The TEC 4000
Small Parts		 The TEC 4000’s centerless diffractometer attaches to the rest of the system by a 15-foot cable (longer lengths optional), accommodating measurements on components ranging in size from 0.5mm to as large as a bridge. The entire system is lightweight and portable, allowing you to perform measurements for maximum efficiency in the laboratory, on the shop floor, or in the field.
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  Dual detectors for swift, precise exposures
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Dual detectors for twin-peak exposures.
Two Peaks		 The TEC 4000 can operate with two detectors, saving time by measuring two psi angles at once. The system can also operate with just one detector if the geometry of the part cannot accommodate two. The detectors provide superior signal-to-noise ratio for precise measurements, so there is no need for background subtraction as required with PDA or CCD detectors. Detector exposure times for steels are often under 10 seconds.
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21.gif (75 bytes) Flexible measurement orientations to accommodate unusual configurations
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Measurements can be made in the psi orientation.
Y Orientation		 Measurements can be made in the omega orientation.
W Orientation		 The detector(s) can be turned 90 degrees to enable measurements to be taken in either the Y or W orientations. This feature accommodates measurements on large or awkward component configurations and increases the flexibility of the TEC 4000.
TEC Materials Testing Division--10737 Lexington Drive, Knoxville, TN USA 37932--865.966.5856
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